Nail StrainStress Meter NM 100

• Unique device to assess nail characteristics.
• Very easy handling of hardware and the well-organized, convenient softwareSeveral safety and comfort features.
• Different, easy to exchange applicators give a number of interesting parameters.
• A variety of settings (pressure force, down step size of the applicator, measurement time, etc.) can be set, in order to meet your individual application.
• Ghost image of T0 as an overlay to aid perfect positioning for optimal reproducibility.
• Quality measures of the curves (R² and deviation) in order to see immediately how good the measurement was taken.
• Zoom in and out of the curves.
• Average up to 4 curves for one measurement.
• Study based simple and quick evaluation of the results in statistical programs possible.

The device features a high precision load cell which measures continuously the pressure needed to step down the special applicator. It is equipped with three different applicator sets for the measurement of various parameters. The applicator heads can be moved down in smallest steps. The steps can be adjusted to the individual needs. Even a precision of 1 µm is possible. The force needed for the deflection of the nail is displayed in real time. As soon as the head touches the surface of the nail the pressure increases. The result is a curve of force and distance (force deflection diagram). Its slope is different depending on interesting mechanical properties of the nail. The highly accurate values have a good reproducibility.

The measurement is absolutely pain-free and the system has several mechanisms to provide comfort and safety all the time during the measurement.

The device is delivered with three different, easy to exchange pressure applicators and nail supports:

Set 1: Transversal deformation: the nail is deflected vertically. The slope of the curve indicates the elastic property of the complete nail. The result is the flattening index for the nail (FI).

Set 2: Resistance to compression force: the nail is deflected punctually. The slope of the curve indicates the structural strength/firmness of the nail. In addition the thickness of the nail can be assessed.

Set 3: Longitudinal deformation: the nail is deflected horizontally. The slope of the curve indicates the elasticity of the distal edge (border) of the nail. The result is the bending index for the nail (BI).

For the first time ever, the mechanical properties of nail can be measured simply and pain-free. This allows to explore a number of new efficacy tests for all kind of nail care products and formulations (nail hardness, firmness, thickness, flexibility/elasticity, structural strength, aging, breaking and more). The device can help to create innovative product and marketing ideas. The system has also application potential in the clinical basic research of nail disorders and diseases as well as other skin diseases presenting nail changes and the quantification of therapies.

Dimensions: approx. 51 (H) x 20.5 (W) x 19.2 (D) cm, Weight: approx. 10.4 kg, Power supply: external 100-240 VAC, 47-63 Hz, DC 12V/9A, Port: USB 2.0, type B connector, Consumption: during measurement approx. 0.3 A, Internal illumination by 18 white LEDs,

Measurement principle: strain-stress measurement of the deflection of the nail by a load/distance diagram

Distance measurement: maximum 10 mm ± 0.02 mm, steps from 1 to 10 µm, measurement uncertainty: 30-70 µm for load of 10 N

Load measurement: high precision load measurement cell, measurement range 0 – 10 N, measurement uncertainty: ± 0.02 N ± 2% of the respective load value

Camera to monitor nail position: built-in 5 Megapixel USB color camera, resolution: 2592 x 1994 Pixel

Computer: Windows^® 10, USB 2.0/3.0, performance must meet system requirements (please ask for computer requirements).

Technical changes may be made without prior notice.